SATDI-IC – Scanning Electron Microscope (6100-LV, JEOL)
Equipment
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Scanning Electron Microscope 6100-LV (JEOL) |
Elche Campus |
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Equipment for the morphological analysis of cell surfaces in tissues and cell cultures and the acquisition of secondary electron imaging (SEI) and backscattered electron imaging (BEI). It also features a microanalysis system (Link Isis L-200 System) with detection of elements from carbon to uranium, using an energy-dispersive X-ray system that allows for the simultaneous acquisition of X-ray maps of up to 30 elements. |
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Temporarily out of service |
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Contact
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Elche Campus VINALOPÓ Building |
View location |
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Current rates (2026)
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Reference |
Description |
Unit |
Unit price UMH (€) |
Unit price for Public Entities (€) |
Unit price for private entities (€) |
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T-ELVI-04 |
Use of the JEOL 6100-LV Scanning Electron Microscope |
hour |
17.11 |
19.80 |
20.98 |
